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Free Design for Testability (DFT) Analysis and Test Coverage Report

Corelis is offering first time users a FREE, step-by-step boundary-scan Design For Testability (DFT) analysis of your design. We will review your design and make specific recommendations that if implemented will improve the testability of your board and will reduce the odds of respinning your first prototype. We will also suggest improvements to your boundary-scan design, that will board test coverage and allow you to implement boundary-scan test and in-system programming in a more cost-effective manner.

This FREE service also includes a test coverage report that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis will provide you with comprehensive test coverage reports that identify all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The DFT report also recommends where to add test points (pads) for physical "nails" access if additional test coverage is required.

We'll deliver a full report of our findings from which you will gain immediate insights into the latest boundary-scan techniques.  Our engineers are ready to guide you through the process on your next design.

Please complete the following form to get started today!

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Please email me the Corelis white paper Design for Testability Guidelines.
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This offer is not available to companies that have previously purchased Corelis products.  Limit one per company.


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Design engineers will benefit by implementing a boundary-scan friendly design.


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