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JTAG Boundary-Scan Software


Home > JTAG Boundary-Scan Products > Software > ScanExpress Runner > Support for In-Circuit Testers and Flying Probes


Support for In-Circuit Testers and Flying Probes

The benefits of boundary-scan are noticeable during all phases of a product life cycle. By coupling the power of ScanExpress boundary-scan tools with that of other production test tools such as In-Circuit Testers (ICT), Manufacturing Defect Analyzers (MDA), and flying probe testers, a complete, integrated solution is now available that offers the combined advantages of all test technologies.

Boundary-scan operates as the perfect companion to ICT or flying probe test systems. Boundary-scan is capable of testing areas of a printed circuit board (PCB) that are difficult to access due to physical space constraints and loss of physical access, often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT). The combination provides greater test coverage and more visibility when faults are detected.

Corelis ScanReuse Methodology

Corelis ScanReuse methodology allows production and manufacturing departments to reuse all boundary-scan test and programming files created during the design and prototype product phases. This methodology conveniently allows tests that were developed on a standalone boundary-scan development station to be directly ported into test equipment that the production and manufacturing departments already owns or may decide to purchase in the future.

Reuse of Boundary-Scan Tests and ISP

Corelis provides its customers with the means to reuse all the boundary-scan test and programming files created with the ScanExpress system with the following testers:

  • Functional testers

  • In-circuit testers (ICTs)

  • Bed of nails testers

  • Flying probes

  • Manufacturing defect analyzers (MDAs)

Corelis has partnered with high profile test equipment manufacturers such as Agilent, Teradyne, CheckSum, Seica, Digitaltest, and others to integrate the ScanExpress boundary-scan tools within these test systems.

Design and test engineers often invest considerable effort creating boundary-scan tests for initial development and prototyping. When the design is released to production, this effort is typically duplicated by redeveloping the same boundary-scan tests from scratch for use on an ICT, flying probe tester, functional tester, or MDA. The integration of Corelis ScanExpress boundary-scan tools was designed specifically to eliminate this redundant effort and hence unify boundary-scan test procedures across the complete product life cycle, saving time, effort and ultimately dollars. Additionally, a more thorough test can often be achieved since the design engineer has unique insight into the details of the design that can be transferred directly to a more complete and robust test procedure. The test procedures passed down from engineering are often matured and refined from usage, making them much more valuable to the repair technician for fault detection and analysis.

Boundary-scan tests, created during development and executed on bench-top systems, can now be applied directly in these test systems. The seamless integration utilizes the testers native software to present faults that are detected by the boundary-scan portion of the test. Specifically, the advanced diagnostic capability of the ScanExpress boundary-scan software identifies the cause of the fault down to the net and pin level.

Please contact Corelis to obtain the latest information regarding packages and support available for your specific test system.  Also see ICT Integration services.

Corelis Software/Hardware Flowchart


CheckSum Analyst Integration
ScanExpress Integration with CheckSum Analyst

ScanExpress Integration with Agilent 3070 ICT
ScanExpress Integration with Agilent 3070 ICT

Teradyne Integration
ScanExpress Integration with Teradyne Test Station

Scorpion Flying Probe Integration
ScanExpress Integration with Scorpion Flying Probe

Digitaltest Flying Probe Integration
ScanExpress Integration with Digitaltest Testers

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