Freescale i.MX35 CPU Support

Ideal for the consumer, industrial, and automotive industries, Freescale ARM11™-based i.MX35 is the basis for many smart embedded systems. Of course, maintaining a high level of system quality and reliability while keeping up with rapid development and production requires an equally smart approach to test - one where the same CPU that drives the system can also provide unparalleled access to system components.

Corelis ScanExpress JET for i.MX35 utilizes the i.MX35 JTAG port to take control of the ARM11 core, enabling fast and easy test development and execution of full Corelis functional test suite for supported peripherals.

ScanExpress JET Freescale i.MX35 Peripheral List

Device Type Part/Model Number

i.MX35 i.MX351, i.MX353, i.MX355, i.MX356, i.MX357

Memory Interfaces (2) SDRAM, mSDRAM, mDDR, DDR2

Flash Interfaces NOR, NAND (3)

Ethernet (EMAC) Integrated

UART Integrated

I2C Integrated

PMIC MC13892

(1) Part list is subject to change. Please contact Corelis for the most current list.
(2) Custom initialization scripts may be required.
(3) NAND Flash bad block management is not currently supported. Call for availability.

Standard Tests

Freescale i.MX35 CPU Support for ScanExpress JET includes automatic test generation for commonly used peripherals.

CPU Initialization - Test basic communication and functions of the CPU.
SDRAM - Execute a full suite of at-speed SDRAM tests to catch hard-to-find faults.
NAND Flash and NOR Flash - Test and program Flash using maximum CPU clock speed.
I2C Discovery - Scan the I2C bus to identify and communicate with connected devices.
UART Loopback - Verify UART communication via a simple loopback cable.
Ethernet Loopback - Test Ethernet functions using a simple loopback cable.
Power Management IC (PMIC) - Ensure that the power management system is fully functional.

Custom Tests

The ScanExpress JET development system includes a powerful scripting language and integrated script debugger; write your own tests or load compiled code right from the JET integrated development environment.

Features, pricing, availability, and specifications are subject to change without notice.

For complete information on ScanExpress JET, please refer to the detailed datasheet for this product.

To speak with a Sales Engineer, please click here.

ScanExpress JET 13 Point Benefit


	The JTAG Embedded Test (JET) method extends coverage beyond popular boundary-scan techniques to virtually every signal of the UUT that is accessible by on-board CPU(s). This includes most of the remaining non-scannable, analog and I/O port resources. Click Here for a list of some important JET Benefits.

Need Assistance?

If you would like assistance with implementing JTAG testing in your design, or you are simply short of resources, our talented and experienced engineering staff can help you with all your JTAG needs.