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Home > Products > JTAG Boundary-Scan Products > JTAG Test and Programming Hardware > JTAG Boundary-Scan Controllers

         
 


JTAG Boundary-Scan Controllers

Corelis has developed a wide range of high-performance boundary-scan controllers that are compatible with buses such as USB 2.0, PCI, PCI Express, PXI/cPCI, Ethernet, VME, and VXI. Most of Corelis' boundary-scan controllers operate up to 80MHz sustained TCK frequency. This wide choice of platforms allows greater flexibility to meet specific price and performance criteria for a given application while maintaining complete software transportability across all hardware platforms.
 

Controller Selection Matrix  (For Legacy controllers, click here.)

The table below lists both current and legacy JTAG controllers offered by Corelis.   Click on the controller model below to find out more about each of our JTAG Boundary-Scan Controllers.  A brief description of each controller follows. For complete information on the controllers, please refer to the detailed datasheets.  For additional feature sets, click here.

Interface

Model

TAPs

TCK Speed  
USB 2.0 USB-1149.1/1E

1

100 MHz
USB-1149.1/1E JTAG Controller

USB-1149.1/1E

USB-1149.1/1E JTAG Controller

The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
The voltage level of the parallel I/O and the TAP interface is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The USB-1149.1/1E TCK output to the IEEE Standard 1149.1 compatible target system is programmable under software control and supports speeds of up to 100MHz.

Other features include automatic signal delay compensation for long cable lengths to the UUT, programmable slew rate control on the TAP signals, and I2C/SPI peripheral interfaces to support programming serial EEPROM devices.

For complete information on the USB-1149.1/1E, please refer to the detailed datasheet for this product.

Download USB-1149.1/1E Datasheet

USB 2.0 USB-1149.1/4E

4

100 MHz

USB-1149.1/4E JTAG Controller

USB-1149.1/4E

USB-1149.1/4E JTAG Controller

The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification (backward compatible with the full-speed features of Revision 1.1).

The voltage level of the parallel I/O and the TAP interface is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The USB-1149.1/4E TCK output to the IEEE Standard 1149.1 compatible target system is programmable under software control and supports speeds of up to 100MHz.
For complete information on the USB-1149.1/4E, please refer to the detailed datasheet for this product.

Download USB-1149.1/4E Datasheet

USB 2.0 & Ethernet NetUSB-1149.1/E

4

80 MHz

NetUSB-1149.1/E JTAG Controller

NetUSB-1149.1/E

NetUSB-1149.1/E JTAG Controller

The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. Up to 512 boards can be tested and programmed concurrently!

The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.

For complete information on these two controllers, please refer to the detailed datasheets.

Download NETUSB-1149.1/E Datasheet

USB 2.0 & Ethernet  NetUSB-1149.1/SE

8

70 MHz

NetUSB-1149.1/SE JTAG Controller

NetUSB-1149.1/SE

NetUSB-1149.1/SE JTAG Controller

The NetUSB-1149.1/SE (8 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/SE controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. Up to 512 boards can be tested and programmed concurrently! The NetUSB-1149.1/SE also supports an analog voltage measuring capability.

The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.

For complete information on these two controllers, please refer to the detailed datasheets.

Download NETUSB-1149.1/SE Datasheet

PCI PCI-1149.1/Turbo

4,8 or 32 (*)

80 MHz

PCI-1149.1/Turbo JTAG Controller

PCI-1149.1/Turbo

PCI-1149.1/Turbo JTAG Controller

The PCI-1149.1/Turbo is a powerful PCI-based controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. When combined with a pod, such as the ScanTAP-4, the PCI-1149.1/Turbo supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. The Controller connects to the pod with a high performance SCSI ribbon cable available in lengths up to 30-feet for easy installation at remote locations.

Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.3V to 3.3V, programmable slew rate control, and pre-power up test for shorts between power and ground lines on the UUT.

Download PCI-1149.1 Turbo Datasheet

PCI Express PCIe-1149.1

4,8 or 32 (*)

80 MHz

PCIe-1149.1 JTAG Controller

PCIe-1149.1

PCIe-1149.1 JTAG Controller

The PCIe-1149.1 is an advanced robust system that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. When combined with a pod, such as the ScanTAP-4, the PCIe-1149.1 supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. The Controller connects to the pod with a high performance SCSI ribbon cable available in lengths up to 30-feet for easy installation at remote locations.

Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.3V to 3.3V, programmable slew rate control, and pre-power up test for shorts between power and ground lines on the UUT.

Download PCIe-1149.1 Datasheet

PXI/cPCI CPXI-1149.1/Turbo

4,8 or 32 (*)

80 MHz
CPXI-1149.1/Turbo JTAG Controller

CPXI-1149.1/Turbo

CPXI-1149.1/Turbo JTAG Controller

The CPXI-1149.1/Turbo is an advanced PXI/cPCI-based controller that is used for testing and in-system programming of devices, boards, or systems compliant with the IEEE-1149.1 standard. When combined with a pod, such as the ScanTAP-4, the CPXI-1149.1/Turbo supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. Up to 8,000 boards can be tested and programmed concurrently!

The controller connects to the pod with a high performance SCSI ribbon cable available in lengths up to 30-feet for easy installation at remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control, and pre-power up test for shorts between power and ground traces on the UUT.

Download CPXI-1149.1/Turbo Datasheet

(*) - With ScanTAP intelligent pod (ScanTAP-4, ScanTAP-8, ScanTAP-32)

 

Optional Accessory Selection Matrix

Model

TAPs

TCK Speed

Interface

 
ScanTAP-IsoPod

1

40 MHz ALL
ScanTAP IsoPod

ScanTAP-IsoPod

ScanTAP IsoPod

The Corelis ScanTAP-IsoPod is an add-on accessory that provides a complete electrical isolation barrier between the target system and the JTAG Test Access Port (TAP). It provides electrical isolation of the JTAG controller TAP signals from the unit under test and enhances the protection of the equipment against harsh electrical environments. The digital isolation offered by the ScanTAP-IsoPod protects boundary-scan controller hardware from ground potential differences that are often present in production floors and in other industrial environments. The ground potential differences are especially harmful when using computer powered USB based test and measurement equipment where the computer and the target system are powered from different AC power line sources in a noisy industrial environment.

For complete information on the ScanTAP-IsoPod, go to the ScanTAP-IsoPod product page

Download ScanTAP-IsoPod Datasheet

ScanTAP Relay

1

50 MHz ScanTAP-4
ScanTAP-8
NetUSB-1149.1/E
NetUSB-1149.1/SE
ScanTAP Relay

ScanTAP Relay

ScanTAP Relay

The ScanTAP Relay pod is an add-on accessory that contains electro-mechanical relays for engaging and disengaging the boundary-scan Test Access Port (TAP) signals. The ScanTAP Relay pod is operated under host software control and provides mechanical isolation of all the TAP signals, including Ground. It is compatible with the various Corelis ScanTAP intelligent modules and is mostly used when integrating the Corelis boundary-scan test tools with in-circuit testers such as the Agilent 3070. By coupling the power of the ScanExpress boundary-scan tools with that of an in-circuit tester (ICT) such as the Agilent 3070 or the Teradyne Test Station, a complete, integrated solution is now available that offers the best advantages of both technologies.

 

Controller Specifications

Programmable Clock

The system-wide TCK rate for all TAP ports is programmable under software control. A wide range of TCK frequencies can be achieved by using the on-board Phase-Locked-Loop (PLL) generation circuitry. Depending on the controller, users are given the ability to select the desired TCK rate from a range of values up to 100 MHz at resolution increments of less than 2%.

Adjustable Low Voltage Outputs

The voltage level of the parallel I/O, the local TAP port, and each pod TAP is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The ports of the ScanTAP-4, ScanTAP-8, and ScanTAP-32 pods can also be slew rate (fast/slow) adjusted.

Scan Input Signal Delay Compensation

Automatic delay compensation is inserted within the signal paths. This feature solves the well-known problems associated with the combination of high TCK rates and remote target locations at extended distances.

Target Voltage Detection System

The controller and its remote pod include analog-to-digital converters, which can measure connected power voltages from the target. Such voltages from two distinct target levels can be measured and compared against user-defined limits. This feature can provide detailed signal voltage checks at any stage of a test plan.

Automatic Detection of UUT Power Shorts

With the target powered down, a well-regulated drive current with current limit can be momentarily applied to the target power bus. By measuring this current, the approximate load resistance can be calculated. This provides for the automatic detection of target power shorts, prior to applying power to the target unit.
 

     

Corelis Software/Hardware Flowchart

Diagram of ScanExpress Software
ScanExpress JET or TPG with Runner and optional software packages
This diagram represents how ScanExpress software works together in providing a solution optimally geared according to your needs.  Click on the diagram to visit individual software/hardware pages, or use the links below.

  • ScanExpress TPG
  • ScanExpress JET
  • ScanExpress DFT Analyzer
  • ScanExpress Merge
  • ScanExpress Runner
  • ScanExpress Runner Gang
  • ScanExpress ADO
  • ScanExpress RunnerClick
  • ScanExpress Viewer
  • ScanExpress Debugger
  • ScanExpress Programmer
  • ScanExpress Flash Generator



  • Use with:

    ScanExpress Runner

    For Low Volume Production

     

    ScanExpress Runner

    For High Volume Production




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