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Home > Products > JTAG Boundary-Scan Products > JTAG Test and Programming Hardware > JTAG Boundary-Scan I/O Modules

         
 


JTAG Boundary-Scan I/O Modules

The Corelis family of SCANIO modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.

The SCANIO products, when combined with a boundary-scan controller, operate as a traditional "bed-of-nails" tester except access to the stimulus and response I/O's is achieved via boundary-scan.

Product Selection Matrix

A listing of available SCANIO modules is provided in the following table:

Model

Description

 
ScanIO-300LV

Digital I/O controller with 300 Pins

ScanIO-300LV Boundary-Scan Digital I/O Module

ScanIO-300LV

ScanIO-300LV Boundary-Scan Digital I/O Module

The ScanIO-300LV digital I/O module turns an IEEE-1149.1 boundary-scan controller (such as the Corelis PCI-1149.1/Turbo or NetUSB-1149.1) into a powerful digital interconnect and functional tester. It uses boundary-scan compatible ASICs to add control and visibility to connectors, traces, and logic that can not be tested using traditional scan techniques. The ScanIO-300LV, combined with a boundary-scan controller, operates as a traditional bed of nails test system except access to the stimulus-and response I/Os is achieved via boundary-scan, and the size and the cost of the system are significantly smaller than traditional testers.

The ScanIO-300LV module provides a total of 300 fully bidirectional test channels with virtually unlimited memory depth per pin. Each line is independently controlled and can be individually configured as an input or output. During testing, the programming and control of the test channels is automatically performed by the ScanExpress tools without any user intervention. The voltage level of the I/O and JTAG interfaces is programmable from 1.25V to 3.3V and supports either single ended or low voltage differential (LVDS) signaling.

Multiple ScanIO-300LV modules can be cascaded in series providing a sufficient number of pins for almost any digital test environment. By using single or multiple ScanIO-300LV modules, existing Automatic Test Pattern Generators (ATPGs) can be used to test non-scannable elements such as connectors, cables, and devices not incorporating boundary-scan. The ScanIO-300LV connects to the UUT inputs and outputs with standard flat-cables that can optionally be terminated with test probes.

Download ScanIO-300LV Datasheet

Scan-PCI PCI/PXI/cPCI boundary-scan tester
ScanPCI Boundary-Scan Based PCI & Compact PCI Card Tester

ScanPCI

ScanPCI Boundary-Scan Based PCI & Compact PCI Card Tester

The ScanPCI boundary-scan based PCI and Compact PCI Card Tester provides a convenient method to test PCI and Compact PCI boards and their card-edge connectors.  The ScanPCI adds boundary-scan control and visibility to PCI and Compact PCI connectors that would otherwise be untestable or require expensive wiring adapter harnesses. 

Even for those PCI and Compact PCI cards that have been designed with boundary-scan testing in mind, the circuitry between the PCI or Compact PCI card edge itself and the PCI interface devices, which typically have JTAG capability, is usually not fully boundary-scan testable. The Corelis ScanPCI provides a way to quickly and easily access these hard to reach connections and increase the boundary-scan test coverage of the Unit Under Test (UUT).

The ScanPCI interfaces with a UUT that is either a 3.3V, 5V, or a Universal voltage device. Refer to the detailed datasheet of the ScanPCI for additional information.

Download Scan-PCI Datasheet

ScanDIMMs Interconnect testing for DIMM sockets
ScanDIMM Boundary-Scan Digital DIMM Socket Tester

ScanDIMMs

ScanDIMM Boundary-Scan Digital DIMM Socket Tester

The ScanDIMM Digital Tester modules are an easy to use tool for interconnect testing of memory DIMM sockets.

Through the use of boundary-scan technology, the ScanDIMM Tester provides fully bi-directional test signals. A boundary-scan Test Access Port (TAP) connects to a host computer which provides virtually unlimited memory depth for testing each of the DIMM socket(s) pins.

DIMM sockets are often used for Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) and other types of memories and the ScanDIMM offers an accurate and easy to use mechanical and electrical solution for testing connections to the DIMM socket(s).

Support is available for a number of DDR, DDR2 and DDR3 modules including 184-pin DIMM, 168-pin DIMM, 144-pin SODIMM, 200-pin SODIMM, 204-pin DIMM, and 240-pin DIMM.

Please refer to the detailed datasheets for the ScanDIMM products for additional information.

Download ScanDIMMs Datasheet


ScanIO-300LV

 

ScanIO-300LV Boundary-Scan Digital I/O Module

The ScanIO-300LV digital I/O module turns an IEEE-1149.1 boundary-scan controller (such as the Corelis PCI-1149.1/Turbo or NetUSB-1149.1) into a powerful digital interconnect and functional tester. It uses boundary-scan compatible ASICs to add control and visibility to connectors, traces, and logic that can not be tested using traditional scan techniques. The ScanIO-300LV, combined with a boundary-scan controller, operates as a traditional bed of nails test system except access to the stimulus-and response I/Os is achieved via boundary-scan, and the size and the cost of the system are significantly smaller than traditional testers.

The ScanIO-300LV module provides a total of 300 fully bidirectional test channels with virtually unlimited memory depth per pin. Each line is independently controlled and can be individually configured as an input or output. During testing, the programming and control of the test channels is automatically performed by the ScanExpress tools without any user intervention. The voltage level of the I/O and JTAG interfaces is programmable from 1.25V to 3.3V and supports either single ended or low voltage differential (LVDS) signaling.

Multiple ScanIO-300LV modules can be cascaded in series providing a sufficient number of pins for almost any digital test environment. By using single or multiple ScanIO-300LV modules, existing Automatic Test Pattern Generators (ATPGs) can be used to test non-scannable elements such as connectors, cables, and devices not incorporating boundary-scan. The ScanIO-300LV connects to the UUT inputs and outputs with standard flat-cables that can optionally be terminated with test probes.

Download ScanIO-300LV Datasheet


ScanPCI

 

ScanPCI Boundary-Scan Based PCI & Compact PCI Card Tester

The ScanPCI boundary-scan based PCI and Compact PCI Card Tester provides a convenient method to test PCI and Compact PCI boards and their card-edge connectors.  The ScanPCI adds boundary-scan control and visibility to PCI and Compact PCI connectors that would otherwise be untestable or require expensive wiring adapter harnesses. 

Even for those PCI and Compact PCI cards that have been designed with boundary-scan testing in mind, the circuitry between the PCI or Compact PCI card edge itself and the PCI interface devices, which typically have JTAG capability, is usually not fully boundary-scan testable. The Corelis ScanPCI provides a way to quickly and easily access these hard to reach connections and increase the boundary-scan test coverage of the Unit Under Test (UUT).

The ScanPCI interfaces with a UUT that is either a 3.3V, 5V, or a Universal voltage device. Refer to the detailed datasheet of the ScanPCI for additional information.

Download ScanPCI Datasheet


ScanDIMMs

 

ScanDIMM Boundary-Scan Digital DIMM Socket Tester

The ScanDIMM Digital Tester modules are an easy to use tool for interconnect testing of memory DIMM sockets.

Through the use of boundary-scan technology, the ScanDIMM Tester provides fully bi-directional test signals. A boundary-scan Test Access Port (TAP) connects to a host computer which provides virtually unlimited memory depth for testing each of the DIMM socket(s) pins.

DIMM sockets are often used for Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) and other types of memories and the ScanDIMM offers an accurate and easy to use mechanical and electrical solution for testing connections to the DIMM socket(s).

Support is available for a number of DDR, DDR2 and DDR3 modules including 184-pin DIMM, 168-pin DIMM, 144-pin SODIMM, 200-pin SODIMM, 204-pin DIMM, and 240-pin DIMM.

Please refer to the detailed datasheets for the ScanDIMM products for additional information.

Download ScanDIMMs Datasheet

     

Boundary-Scan I/O Modules

 

Corelis Software/Hardware Flowchart

Diagram of ScanExpress Software
ScanExpress JET or TPG with Runner and optional software packages
This diagram represents how ScanExpress software works together in providing a solution optimally geared according to your needs.  Click on the diagram to visit individual software/hardware pages, or use the links below.

  • ScanExpress TPG
  • ScanExpress JET
  • ScanExpress DFT Analyzer
  • ScanExpress Merge
  • ScanExpress Runner
  • ScanExpress Runner Gang
  • ScanExpress ADO
  • ScanExpress RunnerClick
  • ScanExpress Viewer
  • ScanExpress Debugger
  • ScanExpress Programmer
  • ScanExpress Flash Generator
  •  



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