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Below is a glossary of commonly used terms throughout the Corelis website.

Term

Definition

ADO

Advanced Diagnostics Option

BDO

Basic Diagnostics Option

BSDL

Boundary-Scan Description Language

CPLD

Complex Programmable Logic Device

CSV

Comma-separated value file (comma-delimited file)

CVF

Compact Vector Format

FIFO

First-In-First-Out

FPI Flash Programming Information
GUI

Graphical User Interface

ETF

Extensible Test Format

IC

Integrated Circuit

IEEE

Institute of Electrical and Electronics Engineers, Inc.

ISP

In-System Programming

JAM

A device programming and test language

JEDEC

The JEDEC Solid State Technology Association (Once known as the Joint Electron Device Engineering Council)

JTAG

IEEE 1149.1 Standard Joint Test Action Group interface

PCB

Printed Circuit Board

SOF

Stop-on-failure

STAPL

Standard Test and Programming Language

SVF

Serial Vector Format

TAP Test Access Port, interface to connect to Corelis Controller
TTD

Truth Table Diagnostics

UUT

Unit Under Test

     

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JTAG Products

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Bus Analyzers

I2C and ARINC-629 Bus Analysis Solutions

Engineering

Engineering

Request DFT Reviews, Test Procedures, and Turn-Key Solutions

Education

JTAG Education

Whitepapers, Demos, Tutorials, and Design Tips

 

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